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John Mark Agosta
Intel Research, Santa Clara
Room 501, IS Building
Tuesday, November 15, 2005
Welcome Coffee - 10:30-11:00
am
Talk - 11:00 -12:00Noon |
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Abstract: A technician's commonly held view is that diagnostic tools should
assemble diagnostic knowledge "automatically" from successful past
diagnoses, so that diagnoses can be replayed when similar symptoms
arise. This contrasts with probabilistic knowledge-based systems methods
where significant time and effort is needed up-front to create
diagnostic models. The naive solution considers diagnostic knowledge as
a database of cases, composed of a set of symptoms that explain the
underlying failure, and the process of diagnosis as one that consists of
database lookup. Of course this retrieval model for diagnosis is a weak
representation compared to a Bayes network representations. The
question is, can we have the best of both worlds---to satisfy the
technician's desires while exploiting the elegance and power of Bayes
networks diagnostics?
If we start from this assumption, the challenge is
if we can construct a Bayes network consistent with the
known set of cases. Unlike a statistical learning paradigm,
each case is considered a probabilistic constraint to
which the convergence of the ultimate model is subject,
rather than a noisy realization of a partial instantiation of the
variables.
This talk will specify this problem precisely, and suggest
how it to approach it.
Speaker's Bio:John Mark Agosta develops diagnostic, optimization and statistical
models to improve Intel products and processes. Previously he has
worked for Edify Corporation, Knowledge Industries, and at SRI
International, building diagnostic and planning models for medical,
equipment, and emergency response applications. Agosta received his
Ph.D. in the Stanford University's Engineering-Economic Systems
Department (now Management Science and Engineering) in 1991.
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